CHArge artiFact supprEssion tool for scanning electRon microscope images
Project description
chafer
CHArge artiFact supprEssion tool for scanning electRon microscope images
Contains:
- functions for upscaling 3D data along X and Y axis, and preserving along Z axis
- unet (fastai) predictor - requires model file
- charge artefact suppression filter for 2D and 3D SEM images - requires respective charge centres to be segmented in a separate file
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