EasyLEED facilitates data analysis of images obtained by low-energy electron diffraction, a common technique in surface science. It aims to automate the process of extracting intensity-energy spectra from a series of diffraction patterns acquired at different beam energies. At its core a tracking algorithm exploiting the specifics of the underlying physics (see paper) allows to link the position of the diffraction maxima between subsequent images.
For more info please see https://andim.github.io/easyleed/ or contact the authors via Email (andimscience@gmail.com) or Twitter (https://twitter.com/andimscience)
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