EasyLEED facilitates data analysis of images obtained by low-energy electron diffraction, a common technique in surface science. It aims to automate the process of extracting intensity-energy spectra from a series of diffraction patterns acquired at different beam energies. At its core a tracking algorithm exploiting the specifics of the underlying physics (see paper) allows to link the position of the diffraction maxima between subsequent images.
For more info please see https://andim.github.io/easyleed/ or contact the authors via Email (andimscience@gmail.com) or Twitter (https://twitter.com/andimscience)
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Release files for EasyLEED 2.5.2
For a detailed explanation of source distributions (sdists) and built distributions (wheels), please see the package formats documentation.
Source distribution (sdist)
| File | Size | Uploaded | |
|---|---|---|---|
| EasyLEED-2.5.2.tar.gz | 29.1 kB | Details |
Release files / EasyLEED-2.5.2.tar.gz
| Download URL | EasyLEED-2.5.2.tar.gz |
|---|---|
| Size | 29.1 kB |
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