CHArge artiFact supprEssion tool for scanning electRon microscope images

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License: Apache Software License (Apache License, Version 2.0)

Author: Luis Perdigao

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chafer

CHArge artiFact supprEssion tool for scanning electRon microscope images

Contains:

  • functions for upscaling 3D data along X and Y axis, and preserving along Z axis
  • unet (fastai) predictor - requires model file
  • charge artefact suppression filter for 2D and 3D SEM images - requires respective charge centres to be segmented in a separate file

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License: Apache Software License (Apache License, Version 2.0)

Author: Luis Perdigao

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0.4

0.3

0.2

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