ddueruem 0.9.0

Wraps feature-model analysis tools into a unified framework and cli.

ddueruem

Supported Tools

ddueruem comes with support for the following libraries. ``Support'' means at a minimum that ddueruem is capable of installing and running these tools.

• Installing: > ddueruem install <tool>
• Running (the tool's CLI): > ddueruem run <tool>

For certain analyses and operations (BDD compilation, Uniform Sampling, T-Wise Sampling), ddueruem also brings a unified CLI that wraps inputs and outputs.

• BDD Compilation: > bdd --help
• Uniform Sampling: > usample --help
• T-Wise Sampling: > tsample --help

Furthermore, ddueruem exposes a unified API for these categories (and also Model Counting), allowing tailored and connected usage (see demos).

BDD Compilation (plugins/bdd)

• CUDD 3.0.0
• CNF2OBDD
• OxiDD

Uniform Sampling (plugins/usample)

• BDDSampler
• CMSGen
• DivKC
• ddnnife (see Frameworks)
• KUS
• Quicksampler
• Smarch
• Spur
• Unigen

T-Wise Sampling (plugin/tsample)

• ddnnife (see Frameworks)
• YASA (FeatJAR, see Frameworks)

Preprocessing (plugin/preprocessing)

• Arjun
• PMC

Frameworks

See plugin/frameworks:

• ddnnife
• FeatJAR

Setup

Requirements

• Python 3.14+

Installation

From PyPi (https://pypi.org/project/ddueruem/):

pip install ddueruem

From Source:

• Clone this repository

• Create a virtual environment: python -m venv .venv

• Activate the virtual environment: source .venv/bin/activate

• Install the dependencies: pip install -e .

• Execute the test suite: python -m pytest tests or ./run_tests.sh

How to cite

Please cite our work from SPLC'22:

@inproceedings{HMT+:SPLC22,
    author = {He\ss{}, Tobias and M\"{u}ller, Tobias and Sundermann, Chico and Th\"{u}m, Thomas},
    title = {ddueruem: a wrapper for feature-model analysis tools},
    year = 2022,
    isbn = {9781450392068},
    publisher = {Association for Computing Machinery},
    address = {New York, NY, USA},
    url = {https://doi.org/10.1145/3503229.3547032},
    doi = {10.1145/3503229.3547032},
    booktitle = {Proceedings of the 26th ACM International Systems and Software Product Line Conference - Volume B},
    pages = {54–57},
    numpages = {4},
    keywords = {benchmark, feature-model analysis, knowledge compilation, sampling},
    location = {Graz, Austria},
    series = {SPLC '22}
}